- backscattered electrons
- розсіяні електрони (напр. розсіяні з області експонування)
English-Ukrainian dictionary of microelectronics. 2013.
English-Ukrainian dictionary of microelectronics. 2013.
Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs … Wikipedia
Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors … Wikipedia
ESEM — stands for environmental scanning electron microscope. This is a scanning electron microscope (SEM) that allows a gaseous environment in the specimen chamber. Whereas all conventional microscopes operate in vacuum, the ESEM has added a new… … Wikipedia
Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… … Wikipedia
surface analysis — ▪ chemistry Introduction in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… … Universalium
microscope — /muy kreuh skohp /, n. 1. an optical instrument having a magnifying lens or a combination of lenses for inspecting objects too small to be seen or too small to be seen distinctly and in detail by the unaided eye. 2. (cap.) Astron. the… … Universalium
Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… … Wikipedia
Electron microscope — Diagram of a transmission electron microscope A 197 … Wikipedia
metallurgy — metallurgic, metallurgical, adj. metallurgically, adv. metallurgist /met l err jist/ or, esp. Brit., /meuh tal euhr jist/, n. /met l err jee/ or, esp. Brit., /meuh tal euhr jee/, n. 1. the technique or science of working or heating metals so as… … Universalium
Proximity effect (electron beam lithography) — The proximity effect in electron beam lithography (EBL) is the phenomenon that the exposure dose distribution, and hence the developed pattern, is wider than the scanned pattern, due to the interactions of the primary beam electrons with the… … Wikipedia
Sekundärelektronenmikroskop — Sekundärelektronenmikroskopisches Bild des Kopfs einer Ameise Bei der Sekundärelektronenmikroskopie (SEM) handelt es sich um die Standardbetriebsart des Rasterelektronenmikroskops (REM, englisch scanning electron microscope).… … Deutsch Wikipedia